Troubleshooting.GIF (2238 bytes)

 

Error Messages During

Electronics Power On Diagnostics

1.) Verify A/D Board

"4.7V Zener failure s/b 3008-4512, Reading =      "

"+5V failure s/b 1880-2120, Reading =          "

"+15V failure s/b 2820-3180, Reading =         "

"-15V failure s/b 2820-3180, Reading =          "

"Sink +5V failure s/b 1800-2200, Reading =     "

"Vth DAC/ADC failure s/b < 751, Reading = 00001, Step = 0001"

"Vsr DAC & Hi-V Power Supply failure s/b < 193, Reading =     "

Vsr Comparator failure - Hi level

Vsr Comparator failure - Lo level

"Isr failure, Level OH - (          )"

"Ith Comparator failure - Lo limit"

"Ith Comparator failure - Hi limit"

"VON Comparator failure"

Cause:  Incorrect A/D board readings during diagnostics.

Correction:

1.) Replace A/D board.

2.) Examine Data Ribbon Cable from computer.

3.) Defective "Interface board" if more than one error conditions.

 

2.) Backplane select logic

"Select logic failed in BP 0 - (      0)"

Cause:  Invalid backplane select.

Correction:

1.) Replace "Distribution Board."

2.) Replace "Power Supply" board if error occurs not in BP 0.

3.)  Replace A/D board if error occurs in BP 0.

4.)  Examine data ribbon cable.

5.)  Defective Point Select Board in Backplane.

6.)  Software is not compatible with hardware.

 

3.) Source node selection logic

"Source select failed in BP 0 - B0, 000"

Cause:  Invalid source node selection data pattern.

Correction:

1.) Replace "Distribution Board."

2.) Examine Data Ribbon Cable.

 

4.) Sink node selection logic

"Sink select failed in BP 0 - B0, 000"

 

5.) Check for resistance /  leakage on sinks

"SHORTED sink at node 0, board 0"

"OPEN transistor at node 0, board 0"

 

6.) Check for resistance /  leakage on sources

"SHORTED sink at node 0, board 0"

"OPEN transistor at node 0, board 0"

 

7.) Check for select / shorted board failures

"Select failure at node 0, board 0 A"

 

1  2  3  4 

Copyright 2000 Test Technology International. All Rights Reserved.